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Title Transient field-resolved reflectometry at 50-100 THz
Date 2024-03-10 Attachment , , , , , , , ,

Transient field-resolved reflectometry at 50-100 THz



Neuhaus, M (Neuhaus, Marcel); Schötz, J (Schoetz, Johannes); Aulich, M (Aulich, Mario); Srivastava, A (Srivastava, Anchit); Kimbaras, D (Kimbaras, Dziugas); Smejkal, V (Smejkal, Valerie); Pervak, V (Pervak, Vladimir); Alharbi, M (Alharbi, Meshaal); Azzeer, AM (Azzeer, Abdallah M.); Libisch, F (Libisch, Florian); Lemell, C (Lemell, Christoph); Burgdörfer, J (Burgdoerfer, Joachim); Wang, ZL (Wang, Zilong); Kling, MF (Kling, Matthias F.) 

Optica, 2022, Volume 9, pp-42-49.

Transient field-resolved spectroscopy enables studies of ultrafast dynamics in molecules, nanostructures, or solids with sub-cycle resolution, but previous work has so far concentrated on extracting the dielectric response at frequencies below 50 THz. Here, we implemented transient field-resolved reflectometry at 50-100 THz(3-6 mu m) with MHz repetition rate employing 800 nm few-cycle excitation pulses that provide sub-10 fs temporal resolution. The capabilities of the technique are demonstrated in studies of ultrafast photorefractive changes in semiconductors Ge and GaAs, where the high frequency range permits to explore the resonance-free Drude response. The extended frequency range in transient field-resolved spectroscopy can further enable studies with so far inaccessible transitions, including intramolecular vibrations in a large range of systems. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.
Center for Molecular Spectroscopy and Dynamics
KU R&D Center, Korea University, Anam-ro 145, Sungbuk-gu, Seoul 02841, Korea
wkdus1228@korea.ac.kr / +82-2-3290-3614
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